Chew, Soo Hoon; Eschen, Wilhelm; Liu, Chang; Abdelaal, Mahmoud; Limpert, Jens; Rothhardt, Jan:
Single-frame randomized probe imaging in the EUV using a high-order harmonic source
In: Optics express, Jg. 34 (2026), Heft 5, S. 7496 - 7508
2026Artikel/Aufsatz in ZeitschriftOA Gold
Physikalisch-Astronomische Fakultät » Institut für Angewandte PhysikWissenschaftliche Zentren » Abbe Center of Photonics (ACP)
Titel in Englisch:
Single-frame randomized probe imaging in the EUV using a high-order harmonic source
Autor*in:
Chew, Soo HoonFSU
GND
1383407819
ORCID
0000-0002-9007-2002ORCID iD
SCOPUS
35071109200
SCOPUS
59708961700
Sonstiges
der Hochschule zugeordnet
korrespondierende*r Autor*in
;
Eschen, WilhelmFSU
GND
1348129972
ORCID
0000-0003-3821-3987ORCID iD
SCOPUS
57195195829
Sonstiges
der Hochschule zugeordnet
;
Liu, ChangFSU
GND
1187763098
GND
1412047501
ORCID
0000-0002-7288-2220ORCID iD
SCOPUS
57221259529
SCOPUS
57803826700
SCOPUS
58627799300
Sonstiges
der Hochschule zugeordnet
;
Abdelaal, MahmoudFSU
GND
1344148115
SCOPUS
57744482200
Sonstiges
der Hochschule zugeordnet
;
Limpert, JensFSU
GND
1149088109
ORCID
0000-0001-8349-3530ORCID iD
SCOPUS
56107885200
SCOPUS
57208171503
SCOPUS
57217695558
SCOPUS
7003432158
Sonstiges
der Hochschule zugeordnet
;
Rothhardt, JanFSU
GND
143513362
ORCID
0000-0002-8007-3327ORCID iD
SCOPUS
12799526100
Sonstiges
der Hochschule zugeordnet
Erscheinungsjahr:
2026
Open-Access-Publikationsweg:
OA Gold
Scopus ID
Sprache des Textes:
Englisch
Datenträgertyp:
Online-Ressource
Ressourcentyp:
Text
Lizenztyp:
CC BY 4.0
Access Rights:
Open Access
Peer Reviewed:
Ja
Teil der Statistik:
Ja

Abstract in Englisch:

We report the demonstration of single-frame randomized probe imaging (RPI) using a 13.5 nm extreme ultraviolet (EUV) beam from a table-top high-harmonic generation (HHG) source. Three types of beams—a smooth, vortex, and speckle beam—were used to investigate the effect of different illuminations on image quality. Single-frame RPI reconstructions were successfully achieved for all beam types, with the highest resolution of 110 nm obtained using the EUV speckle beam. Comparisons with ptychography reconstructions confirm the advantages of structured illuminations over a smooth beam, showing improved convergence and image fidelity. Furthermore, averaging a small number of RPI images reconstructed from individual diffraction patterns significantly improves the resolution to sub-100 nm. These results demonstrate the capability of single-frame RPI to deliver rapid, high-resolution EUV imaging, offering a promising approach for applications limited by acquisition time, such as ultrafast pump-probe studies and real-time feedback.